Digital Sensor IP is a hardware security component designed to detect fault injection attacks on cryptographic devices and embedded systems. The sensor monitors various physical attack vectors including clock frequency manipulation (clock glitches, overclocking), voltage variations (power glitches, underfeeding), temperature modifications, and radiation-based attacks (laser, electromagnetic fault injection). The technology converts all monitored physical stresses into timing stress measurements. When a threat is detected, the sensor provides a measurement of the threat level and triggers a hardware alarm in real-time. The sensor is implemented as a fully digital design using standard cell libraries, making it transferable to any design kit. The IP is designed to be difficult for attackers to identify as it blends into the rest of the system design. It supports both global and local fault injection detection, including laser attacks, electromagnetic fault injection (EMFI), clock manipulation, and temperature-based attacks. The sensor includes built-in health tests to validate IP integrity during boot and on-demand. The technology has been tested in the Security Science Factory Laboratory using both global stress methods (clock glitches) and local stress methods (electromagnetic injection). It is designed to be security certification ready, including Common Criteria compliance. The sensor supports Dynamic Voltage and Frequency Scaling (DVFS) and is compatible with clock gating features. Multiple sensors can be connected to a single bus interface, and the design requires no calibration after implementation.